Domen Tabernik, Matej Kristan, Marko Boben, Ales Leonardis. Learning statistically relevant edge structure improves low-level visual descriptors. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 1471-1474, IEEE, 2012. [doi]
Abstract is missing.