Mihai Tache, Valeriu Beiu, Walid Ibrahim, Fekri Kharbash, Massimo Alioto. Enhancing the Static Noise Margins by Upsizing Length for Ultra-Low Voltage/Power/Energy Gates. J. Low Power Electronics, 10(1):137-148, 2014. [doi]
@article{TacheBIKA14,
title = {Enhancing the Static Noise Margins by Upsizing Length for Ultra-Low Voltage/Power/Energy Gates},
author = {Mihai Tache and Valeriu Beiu and Walid Ibrahim and Fekri Kharbash and Massimo Alioto},
year = {2014},
doi = {10.1166/jolpe.2014.1305},
url = {http://dx.doi.org/10.1166/jolpe.2014.1305},
researchr = {https://researchr.org/publication/TacheBIKA14},
cites = {0},
citedby = {0},
journal = {J. Low Power Electronics},
volume = {10},
number = {1},
pages = {137-148},
}