Naomi Tack, Bayu Adhi Tama, Atefeh Jebeli, Vandana P. Janeja, Don Engel, Rebecca Williams. Metrics for the Quality and Consistency of Ice Layer Annotations. In IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2023, Pasadena, CA, USA, July 16-21, 2023. pages 4935-4938, IEEE, 2023. [doi]
Abstract is missing.