Testing of Sense Amplifier in Dynamic Memory

T. Tada, T. Kobayashi, K. Okada, Y. Kuramitsu. Testing of Sense Amplifier in Dynamic Memory. In Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982. pages 245-251, IEEE Computer Society, 1982.

@inproceedings{TadaKOK82,
  title = {Testing of Sense Amplifier in Dynamic Memory},
  author = {T. Tada and T. Kobayashi and K. Okada and Y. Kuramitsu},
  year = {1982},
  tags = {testing},
  researchr = {https://researchr.org/publication/TadaKOK82},
  cites = {0},
  citedby = {0},
  pages = {245-251},
  booktitle = {Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982},
  publisher = {IEEE Computer Society},
}