Desta Tadesse, R. Iris Bahar, Joel Grodstein. Fast Measurement of the Non-Deterministic Zone in Microprocessor Debug Using Maximum Likelihood Estimation. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 339-344, IEEE Computer Society, 2008. [doi]
@inproceedings{TadesseBG08,
title = {Fast Measurement of the Non-Deterministic Zone in Microprocessor Debug Using Maximum Likelihood Estimation},
author = {Desta Tadesse and R. Iris Bahar and Joel Grodstein},
year = {2008},
doi = {10.1109/VTS.2008.18},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.18},
tags = {debugging},
researchr = {https://researchr.org/publication/TadesseBG08},
cites = {0},
citedby = {0},
pages = {339-344},
booktitle = {26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA},
publisher = {IEEE Computer Society},
}