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Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors

Kunhee Tae, Danyoung Cha, Gyoungyeop do, Nayeong Lee, Sungsik Lee. Weight-Update Characteristics Dependent on Carrier Densities of Hf-ZnO Charge-Trap Layers in Sub-Threshold Synaptic Transistors. IEEE Access, 12:179813-179822, 2024. [doi]

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