Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling

Enkelejda Tafaj, Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty. Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 544-551, IEEE Computer Society, 2005. [doi]

Authors

Enkelejda Tafaj

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Paul M. Rosinger

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Bashir M. Al-Hashimi

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Krishnendu Chakrabarty

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