Enkelejda Tafaj, Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu Chakrabarty. Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 544-551, IEEE Computer Society, 2005. [doi]
@inproceedings{TafajRAC05,
title = {Improving Thermal-Safe Test Scheduling for Core-Based Systems-on-Chip Using Shift Frequency Scaling},
author = {Enkelejda Tafaj and Paul M. Rosinger and Bashir M. Al-Hashimi and Krishnendu Chakrabarty},
year = {2005},
doi = {10.1109/DFTVS.2005.40},
url = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2005.40},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/TafajRAC05},
cites = {0},
citedby = {0},
pages = {544-551},
booktitle = {20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2464-8},
}