Testing for resistive open defects in FPGAs

Mehdi Baradaran Tahoori. Testing for resistive open defects in FPGAs. In Proceedings of the 2002 IEEE International Conference on Field-Programmable Technology, FPT 2002, Hong Kong, China, December 16-18, 2002. pages 332-335, IEEE, 2002. [doi]

Authors

Mehdi Baradaran Tahoori

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