Mehdi Baradaran Tahoori. Testing for resistive open defects in FPGAs. In Proceedings of the 2002 IEEE International Conference on Field-Programmable Technology, FPT 2002, Hong Kong, China, December 16-18, 2002. pages 332-335, IEEE, 2002. [doi]
@inproceedings{Tahoori02a, title = {Testing for resistive open defects in FPGAs}, author = {Mehdi Baradaran Tahoori}, year = {2002}, doi = {10.1109/FPT.2002.1188704}, url = {http://dx.doi.org/10.1109/FPT.2002.1188704}, researchr = {https://researchr.org/publication/Tahoori02a}, cites = {0}, citedby = {0}, pages = {332-335}, booktitle = {Proceedings of the 2002 IEEE International Conference on Field-Programmable Technology, FPT 2002, Hong Kong, China, December 16-18, 2002}, publisher = {IEEE}, isbn = {0-7803-7574-2}, }