Mehdi Baradaran Tahoori, Rob Aitken, Sriram R. Vangal, Bal Sandhu. Test implications and challenges in near threshold computing special session. In 34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016. pages 1, IEEE Computer Society, 2016. [doi]
@inproceedings{TahooriAVS16,
title = {Test implications and challenges in near threshold computing special session},
author = {Mehdi Baradaran Tahoori and Rob Aitken and Sriram R. Vangal and Bal Sandhu},
year = {2016},
doi = {10.1109/VTS.2016.7477295},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2016.7477295},
researchr = {https://researchr.org/publication/TahooriAVS16},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {34th IEEE VLSI Test Symposium, VTS 2016, Las Vegas, NV, USA, April 25-27, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-8454-4},
}