Prolongation of Lifetime and the Evaluation Method of Dependable SSD - researchr publication authors

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Kensuke Tai, Masato Kitakami. Prolongation of Lifetime and the Evaluation Method of Dependable SSD. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 373-381, IEEE Computer Society, 2010. [doi]

This author has not been identified. Look up 'Kensuke Tai' in GoogleThis author has not been identified. Look up 'Masato Kitakami' in Google

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