Ann T. Tai, Chris J. Walter, Lorraine M. Fesq, John C. Day. Fault-class-aware fault tree generation and analysis. In IEEE 24th International Symposium on Software Reliability Engineering, ISSRE 2013, Pasadena, CA, USA, November 4-7, 2013 - Supplemental Proceedings. pages 84, IEEE, 2013. [doi]
Abstract is missing.