Touraj Tajbakhsh. Efficient defect pixel cluster detection and correction for Bayer CFA image sequences. In Francisco H. Imai, Feng Xiao, editors, Digital Photography VII, part of the IS&T-SPIE Electronic Imaging Symposium, San Francisco Airport, California, USA, January 23, 2011, Proceedings. Volume 7876 of SPIE Proceedings, SPIE/IS&T, 2011. [doi]
Abstract is missing.