Yasuhiro Takahashi, Akinori Maeda, Mitsuhiro Ogura. Actual implementation of multi domain test: Further reduction of cost of test. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-8, IEEE, 2011. [doi]
@inproceedings{TakahashiMO11,
title = {Actual implementation of multi domain test: Further reduction of cost of test},
author = {Yasuhiro Takahashi and Akinori Maeda and Mitsuhiro Ogura},
year = {2011},
doi = {10.1109/TEST.2011.6139135},
url = {http://dx.doi.org/10.1109/TEST.2011.6139135},
researchr = {https://researchr.org/publication/TakahashiMO11},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011},
editor = {Bill Eklow and R. D. (Shawn) Blanton},
publisher = {IEEE},
isbn = {978-1-4577-0153-5},
}