Insect classification using Scanning Electron Microphotographs considering magnifications

Akihiro Takahashi, Takahiro Ogawa, Miki Haseyama. Insect classification using Scanning Electron Microphotographs considering magnifications. In IEEE International Conference on Image Processing, ICIP 2013, Melbourne, Australia, September 15-18, 2013. pages 3269-3273, IEEE, 2013. [doi]

Abstract

Abstract is missing.