H. Takahashi, Y. Okamoto, Toshiki Hamada, Y. Komura, S. Watanabe, K. Tsuda, H. Sawai, Takanori Matsuzaki, Yoshinori Ando, Tatsuya Onuki, H. Kunitake, Shunpei Yamazaki, D. Kobayashi, A. Ikuta, Takahiro Makino, Takeshi Ohshima. Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]
@inproceedings{TakahashiOHKWTSMAOKYKIMO23,
title = {Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory},
author = {H. Takahashi and Y. Okamoto and Toshiki Hamada and Y. Komura and S. Watanabe and K. Tsuda and H. Sawai and Takanori Matsuzaki and Yoshinori Ando and Tatsuya Onuki and H. Kunitake and Shunpei Yamazaki and D. Kobayashi and A. Ikuta and Takahiro Makino and Takeshi Ohshima},
year = {2023},
doi = {10.1109/IRPS48203.2023.10118302},
url = {https://doi.org/10.1109/IRPS48203.2023.10118302},
researchr = {https://researchr.org/publication/TakahashiOHKWTSMAOKYKIMO23},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}