Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT

Kenichi Takatori, Hideki Asada, Setsuo Kaneko. Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT. IEICE Transactions, 91-C(10):1564-1569, 2008. [doi]

Authors

Kenichi Takatori

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Hideki Asada

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Setsuo Kaneko

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