Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT

Kenichi Takatori, Hideki Asada, Setsuo Kaneko. Back- and Front-Interface Trap Densities Evaluation and Stress Effect of Poly-Si TFT. IEICE Transactions, 91-C(10):1564-1569, 2008. [doi]

Abstract

Abstract is missing.