Takafumi Takatsuka, Jun Ogi, Y. Ikeda, Kazuki Hizu, Yutaka Inaoka, S. Sakama, I. Watanabe, T. Ishikawa, S. Shimada, J. Suzuki, H. Maeda, K. Toshima, Y. Nonaka, A. Yamamura, H. Ozawa, F. Koga, Yusuke Oike. A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{TakatsukaOIHISW23,
title = {A 3.36 µm-pitch SPAD photon-counting image sensor using clustered multi-cycle clocked recharging technique with intermediate most-significant-bit readout},
author = {Takafumi Takatsuka and Jun Ogi and Y. Ikeda and Kazuki Hizu and Yutaka Inaoka and S. Sakama and I. Watanabe and T. Ishikawa and S. Shimada and J. Suzuki and H. Maeda and K. Toshima and Y. Nonaka and A. Yamamura and H. Ozawa and F. Koga and Yusuke Oike},
year = {2023},
doi = {10.23919/VLSITechnologyandCir57934.2023.10185241},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185241},
researchr = {https://researchr.org/publication/TakatsukaOIHISW23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
publisher = {IEEE},
isbn = {978-4-86348-806-9},
}