Redefinition of Write Margin for Next-Generation SRAM and Write-Margin Monitoring Circuit

K. Takeda, H. Ikeda, Y. Hagihara, M. Nomura, H. Kobatake. Redefinition of Write Margin for Next-Generation SRAM and Write-Margin Monitoring Circuit. In 2006 IEEE International Solid State Circuits Conference, ISSCC 2006, Digest of Technical Papers, an Francisco, CA, USA, February 6-9, 2006. pages 2602-2611, IEEE, 2006. [doi]

Authors

K. Takeda

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H. Ikeda

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Y. Hagihara

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M. Nomura

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H. Kobatake

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