Learning from Noisy Labeled Data Using Symmetric Cross-Entropy Loss for Image Classification - researchr publication authors

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Hiroshi Takeda, Soh Yoshida, Mitsuji Muneyasu. Learning from Noisy Labeled Data Using Symmetric Cross-Entropy Loss for Image Classification. In 9th IEEE Global Conference on Consumer Electronics, GCCE 2020, Kobe, Japan, October 13-16, 2020. pages 709-711, IEEE, 2020. [doi]

This author has not been identified. Look up 'Hiroshi Takeda' in GoogleThis author has not been identified. Look up 'Soh Yoshida' in GoogleThis author has not been identified. Look up 'Mitsuji Muneyasu' in Google

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