Hiroshi Takeda, Soh Yoshida, Mitsuji Muneyasu. Learning from Noisy Labeled Data Using Symmetric Cross-Entropy Loss for Image Classification. In 9th IEEE Global Conference on Consumer Electronics, GCCE 2020, Kobe, Japan, October 13-16, 2020. pages 709-711, IEEE, 2020. [doi]
@inproceedings{TakedaYM20,
title = {Learning from Noisy Labeled Data Using Symmetric Cross-Entropy Loss for Image Classification},
author = {Hiroshi Takeda and Soh Yoshida and Mitsuji Muneyasu},
year = {2020},
doi = {10.1109/GCCE50665.2020.9291873},
url = {https://doi.org/10.1109/GCCE50665.2020.9291873},
researchr = {https://researchr.org/publication/TakedaYM20},
cites = {0},
citedby = {0},
pages = {709-711},
booktitle = {9th IEEE Global Conference on Consumer Electronics, GCCE 2020, Kobe, Japan, October 13-16, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9802-6},
}