Hiroshi Takeda, Soh Yoshida, Mitsuji Muneyasu. Learning from Noisy Labeled Data Using Symmetric Cross-Entropy Loss for Image Classification. In 9th IEEE Global Conference on Consumer Electronics, GCCE 2020, Kobe, Japan, October 13-16, 2020. pages 709-711, IEEE, 2020. [doi]
@inproceedings{TakedaYM20, title = {Learning from Noisy Labeled Data Using Symmetric Cross-Entropy Loss for Image Classification}, author = {Hiroshi Takeda and Soh Yoshida and Mitsuji Muneyasu}, year = {2020}, doi = {10.1109/GCCE50665.2020.9291873}, url = {https://doi.org/10.1109/GCCE50665.2020.9291873}, researchr = {https://researchr.org/publication/TakedaYM20}, cites = {0}, citedby = {0}, pages = {709-711}, booktitle = {9th IEEE Global Conference on Consumer Electronics, GCCE 2020, Kobe, Japan, October 13-16, 2020}, publisher = {IEEE}, isbn = {978-1-7281-9802-6}, }