Tatsuya Takeshita, Ryuzo Iga, Mitsuo Yamamoto, Mitsuru Sugo. Analysis of interior degradation of a laser waveguide using an OBIC monitor. Microelectronics Reliability, 47(12):2135-2140, 2007. [doi]
@article{TakeshitaIYS07,
title = {Analysis of interior degradation of a laser waveguide using an OBIC monitor},
author = {Tatsuya Takeshita and Ryuzo Iga and Mitsuo Yamamoto and Mitsuru Sugo},
year = {2007},
doi = {10.1016/j.microrel.2007.01.001},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.001},
tags = {analysis},
researchr = {https://researchr.org/publication/TakeshitaIYS07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {12},
pages = {2135-2140},
}