Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya. FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. In nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016. pages 265-268, IEEE, 2016. [doi]
@inproceedings{TakeuchiSOSNT16,
title = {FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs},
author = {Kan Takeuchi and Masaki Shimada and Takeshi Okagaki and Koji Shibutani and Koji Nii and Fumio Tsuchiya},
year = {2016},
doi = {10.1109/ESSCIRC.2016.7598293},
url = {http://dx.doi.org/10.1109/ESSCIRC.2016.7598293},
researchr = {https://researchr.org/publication/TakeuchiSOSNT16},
cites = {0},
citedby = {0},
pages = {265-268},
booktitle = {nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2972-3},
}