Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya. FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. In nd European Solid-State Circuits Conference, Lausanne, Switzerland, September 12-15, 2016. pages 265-268, IEEE, 2016. [doi]
Abstract is missing.