Gauthier Tallec, Edouard Yvinec, Arnaud Dapogny, Kevin Bailly. Fighting Over-Fitting with Quantization for Learning Deep Neural Networks on Noisy Labels. In IEEE International Conference on Image Processing, ICIP 2023, Kuala Lumpur, Malaysia, October 8-11, 2023. pages 575-579, IEEE, 2023. [doi]
Abstract is missing.