Wing-Shan Tam, Oi-Ying Wong, Tsz-Ching Ng, Chi-Wah Kok, Hei Wong. Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure. Microelectronics Reliability, 50(5):622-626, 2010. [doi]
@article{TamWNKW10,
title = {Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure},
author = {Wing-Shan Tam and Oi-Ying Wong and Tsz-Ching Ng and Chi-Wah Kok and Hei Wong},
year = {2010},
doi = {10.1016/j.microrel.2010.01.047},
url = {http://dx.doi.org/10.1016/j.microrel.2010.01.047},
tags = {optimization, analysis},
researchr = {https://researchr.org/publication/TamWNKW10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {5},
pages = {622-626},
}