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Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure

Wing-Shan Tam, Oi-Ying Wong, Tsz-Ching Ng, Chi-Wah Kok, Hei Wong. Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure. Microelectronics Reliability, 50(5):622-626, 2010. [doi]

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