Teruo Tamama, Naoaki Narumi, Taiichi Otsuji, Masao Suzuki, Tsuneta Sudo. Key Technologies for 500 MHz VLSI Test System ULTIMATE . In Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988. pages 108-113, IEEE Computer Society, 1988.
@inproceedings{TamamaNOSS88,
title = {Key Technologies for 500 MHz VLSI Test System ULTIMATE },
author = {Teruo Tamama and Naoaki Narumi and Taiichi Otsuji and Masao Suzuki and Tsuneta Sudo},
year = {1988},
tags = {testing},
researchr = {https://researchr.org/publication/TamamaNOSS88},
cites = {0},
citedby = {0},
pages = {108-113},
booktitle = {Proceedings International Test Conference 1988, Washington, D.C., USA, September 1988},
publisher = {IEEE Computer Society},
}