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Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment

Lucas A. Tambara, Eduardo Chielle, Fernanda Lima Kastensmidt, G. Tsiligiannis, S. Danzeca, M. Brugger, A. Masi. Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment. Microelectronics Reliability, 76:640-643, 2017. [doi]

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