A multi-attribute classification fusion system for insulated gate bipolar transistor diagnostics

Prasanna Tamilselvan, Pingfeng Wang, Michael Pecht. A multi-attribute classification fusion system for insulated gate bipolar transistor diagnostics. Microelectronics Reliability, 53(8):1117-1129, 2013. [doi]

Authors

Prasanna Tamilselvan

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Pingfeng Wang

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Michael Pecht

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