Prasanna Tamilselvan, Pingfeng Wang, Michael Pecht. A multi-attribute classification fusion system for insulated gate bipolar transistor diagnostics. Microelectronics Reliability, 53(8):1117-1129, 2013. [doi]
@article{TamilselvanWP13,
title = {A multi-attribute classification fusion system for insulated gate bipolar transistor diagnostics},
author = {Prasanna Tamilselvan and Pingfeng Wang and Michael Pecht},
year = {2013},
doi = {10.1016/j.microrel.2013.04.011},
url = {http://dx.doi.org/10.1016/j.microrel.2013.04.011},
researchr = {https://researchr.org/publication/TamilselvanWP13},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {53},
number = {8},
pages = {1117-1129},
}