Wen Tan, Caifen Fu. Analysis of active disturbance rejection control for processes with time delay. In American Control Conference, ACC 2015, Chicago, IL, USA, July 1-3, 2015. pages 3962-3967, IEEE, 2015. [doi]
@inproceedings{TanF15-0,
title = {Analysis of active disturbance rejection control for processes with time delay},
author = {Wen Tan and Caifen Fu},
year = {2015},
doi = {10.1109/ACC.2015.7171948},
url = {http://dx.doi.org/10.1109/ACC.2015.7171948},
researchr = {https://researchr.org/publication/TanF15-0},
cites = {0},
citedby = {0},
pages = {3962-3967},
booktitle = {American Control Conference, ACC 2015, Chicago, IL, USA, July 1-3, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8684-2},
}