Li Tan, Jesung Kim, Oleg Sokolsky, Insup Lee. Model-based Testing and Monitoring for Hybrid Embedded Systems. In Du Zhang, Éric Grégoire, Doug DeGroot, editors, Proceedings of the 2004 IEEE International Conference on Information Reuse and Integration, IRI - 2004, November 8-10, 2004, Las Vegas Hilton, Las Vegas, NV, USA. pages 487-492, IEEE Systems, Man, and Cybernetics Society, 2004.
Abstract is missing.