Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition

Zichang Tan, Ajian Liu, Jun Wan 0001, Hao Li 0030, Zhen Lei 0001, Guodong Guo, Stan Z. Li. Cross-Batch Hard Example Mining With Pseudo Large Batch for ID vs. Spot Face Recognition. IEEE Transactions on Image Processing, 31:3224-3235, 2022. [doi]

Abstract

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