A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode

Ligang Tan, Ziwen Li, Yunxiu Xiang, Pengfei Feng, Yage Guo. A critical analysis of the bulk current injection immunity test based on common-mode and differential-mode. Microelectronics Reliability, 91:188-193, 2018. [doi]

Abstract

Abstract is missing.