Vegetation Phenology Metrics Derived from Temporally Smoothed and Gap-Filled MODIS Data - researchr publication authors

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Bin Tan, Jeffrey T. Morisette, Robert E. Wolfe, Feng Gao, Gregory A. Ederer, Joanne M. Nightingale, Jeffrey A. Pedelty. Vegetation Phenology Metrics Derived from Temporally Smoothed and Gap-Filled MODIS Data. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings. pages 593-596, IEEE, 2008. [doi]

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