Bin Tan, Jeffrey T. Morisette, Robert E. Wolfe, Feng Gao, Gregory A. Ederer, Joanne M. Nightingale, Jeffrey A. Pedelty. Vegetation Phenology Metrics Derived from Temporally Smoothed and Gap-Filled MODIS Data. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings. pages 593-596, IEEE, 2008. [doi]
@inproceedings{TanMWGENP08,
title = {Vegetation Phenology Metrics Derived from Temporally Smoothed and Gap-Filled MODIS Data},
author = {Bin Tan and Jeffrey T. Morisette and Robert E. Wolfe and Feng Gao and Gregory A. Ederer and Joanne M. Nightingale and Jeffrey A. Pedelty},
year = {2008},
doi = {10.1109/IGARSS.2008.4779417},
url = {http://dx.doi.org/10.1109/IGARSS.2008.4779417},
researchr = {https://researchr.org/publication/TanMWGENP08},
cites = {0},
citedby = {0},
pages = {593-596},
booktitle = {IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings},
publisher = {IEEE},
}