Test Generation for Specifications Modeled by Input/Output Automata

Q. M. Tan, Alexandre Petrenko. Test Generation for Specifications Modeled by Input/Output Automata. In Alexandre Petrenko, Nina Yevtushenko, editors, Testing of Communicating Systems, IFIP TC6 11th International Workshop on Testing Communicating Systems (IWTCS), August 31 - September 2, 1998, Tomsk, Russia. Volume 131 of IFIP Conference Proceedings, pages 83-100, Kluwer, 1998.

Abstract

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