Wen'an Tan, Pan Wang. A method towards process similarity measurement according to constrained traces. In Weiming Shen, Pedro Antunes, Nguyen Hoang Thuan, Jean-Paul A. Barthès, Junzhou Luo, Jianming Yong, editors, 21st IEEE International Conference on Computer Supported Cooperative Work in Design, CSCWD 2017, Wellington, New Zealand, April 26-28, 2017. pages 79-84, IEEE, 2017. [doi]
Abstract is missing.