Eiichi Tanaka, Hiroaki Awano, Sumio Masuda. A Proximity Measure of Line Drawings for Comparison of Chemical Compounds. In Dmitry Chetverikov, Walter G. Kropatsch, editors, Computer Analysis of Images and Patterns, 5th International Conference, CAIP 93, Budapest, Hungary, September 13-15, 1993, Proceedings. Volume 719 of Lecture Notes in Computer Science, pages 291-298, Springer, 1993.
Abstract is missing.