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Study on the optical damage mechanism of InP IQ modulators using a step stress test

Hajime Tanaka, Tsutomu Ishikawa, Mitsuru Ekawa. Study on the optical damage mechanism of InP IQ modulators using a step stress test. In 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC), Fukuoka, Japan, July 7-11, 2019. pages 1-3, IEEE, 2019. [doi]

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Hajime Tanaka

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Tsutomu Ishikawa

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Mitsuru Ekawa

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