Kenichiro Tanaka, Yasuhiro Mukaigawa, Takuya Funatomi, Hiroyuki Kubo, Yasuyuki Matsushita, Yasushi Yagi. Material Classification from Time-of-Flight Distortions. IEEE Trans. Pattern Anal. Mach. Intell., 41(12):2906-2918, 2019. [doi]
Abstract is missing.