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Understanding the Relation Between the Performance and Reliability of nand Flash/SCM Hybrid Solid-State Drive

Shuhei Tanakamaru, Shogo Hosaka, Koh Johguchi, Hirofumi Takishita, Ken Takeuchi. Understanding the Relation Between the Performance and Reliability of nand Flash/SCM Hybrid Solid-State Drive. IEEE Trans. VLSI Syst., 24(6):2208-2219, 2016. [doi]

Authors

Shuhei Tanakamaru

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Shogo Hosaka

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Koh Johguchi

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Hirofumi Takishita

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Ken Takeuchi

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