Temperature Characterisation of the DSP Delay Line

Scott Tancock, John G. Rarity, Naim Dahnoun. Temperature Characterisation of the DSP Delay Line. In 7th International Conference on Event-Based Control, Communication, and Signal Processing, EBCCSP 2021, Krakow, Poland, June 22-25, 2021. pages 1-8, IEEE, 2021. [doi]

Abstract

Abstract is missing.