James S. Tandon, Masahiro Sasaki, Makoto Ikeda, Kunihiro Asada. A design-for-test apparatus for measuring on-chip temperature with fine granularity. In Keith A. Bowman, Kamesh V. Gadepally, Pallab Chatterjee, Mark M. Budnik, Lalitha Immaneni, editors, Thirteenth International Symposium on Quality Electronic Design, ISQED 2012, Santa Clara, CA, USA, March 19-21, 2012. pages 27-32, IEEE, 2012. [doi]
Abstract is missing.