Kunal Taneja, Yi Zhang, Tao Xie. MODA: automated test generation for database applications via mock objects. In Charles Pecheur, Jamie Andrews, Elisabetta Di Nitto, editors, ASE 2010, 25th IEEE/ACM International Conference on Automated Software Engineering, Antwerp, Belgium, September 20-24, 2010. pages 289-292, ACM, 2010. [doi]
Abstract is missing.