Accurate 3D face registration based on the symmetry plane analysis on nose regions

X. M. Tang, J. S. Chen, Yiu Sang Moon. Accurate 3D face registration based on the symmetry plane analysis on nose regions. In 2008 16th European Signal Processing Conference, EUSIPCO 2008, Lausanne, Switzerland, August 25-29, 2008. pages 1-5, IEEE, 2008. [doi]

Abstract

Abstract is missing.