Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy. Improving compressed test pattern generation for multiple scan chain failure diagnosis. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1000-1005, IEEE, 2009. [doi]
@inproceedings{TangGCR09,
title = {Improving compressed test pattern generation for multiple scan chain failure diagnosis},
author = {Xun Tang and Ruifeng Guo and Wu-Tung Cheng and Sudhakar M. Reddy},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090810&count=326&index=196},
tags = {testing},
researchr = {https://researchr.org/publication/TangGCR09},
cites = {0},
citedby = {0},
pages = {1000-1005},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}